Shevchuk, V. N.Kayun, I. V.2018-04-022018-04-022017-05-292017-05-29Shevchuk V. N. Analysis of Electromigration in MWO4 (M=Ca, Cd, Pb, Zn) Crystals and their Structural Defects / V. N. Shevchuk, I. V. Kayun // Oxide Materials for Electronic Engineering – fabrication, properties and applications : book of abstracts international conference, May 29–June 2, 2017 Lviv, Ukraine. — Lviv, 2017. — P. 61. — (2 active media fundamentals: crystal structure and defects).https://ena.lpnu.ua/handle/ntb/4017361enAnalysis of Electromigration in MWO4 (M=Ca, Cd, Pb, Zn) Crystals and their Structural DefectsConference Abstract© Національний університет “Львівська політехніка”, 20171Shevchuk V. N. Analysis of Electromigration in MWO4 (M=Ca, Cd, Pb, Zn) Crystals and their Structural Defects / V. N. Shevchuk, I. V. Kayun // Oxide Materials for Electronic Engineering – fabrication, properties and applications : book of abstracts international conference, May 29–June 2, 2017 Lviv, Ukraine. — Lviv, 2017. — P. 61. — (2 active media fundamentals: crystal structure and defects).