Remanent resistance changes at pcmo-metal interfaces: electrical induced polaron ordering
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Date
2009
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Publisher
Видавництво національного університету „Львівська політехніка”
Abstract
Description
Keywords
electric pulse induced resistance changes (EPIR), RRAM-technologies
Citation
Remanent resistance changes at pcmo-metal interfaces: electrical induced polaron ordering / B.-U. Meyer, M. Scherff, J. Hoffmann, L. Whu, Y. Zhu, Ch. Jooss // Oxide materials for electronic engineering – fabrication, properties and application OMEE-2009 : international scientific workshop, June 22–26, 2009, Lviv, Ukraine : book of abstracts / Lviv Polytechnic National University. – Lviv, 2009. – P. 147.