Browsing by Author "Yakovyna, V."

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    Challenges of Using Machine Learning Algorithms for Evaluating and Predicting Software Defects
    (Видавництво Львівської політехніки, 2024-05-23) Yakovyna, V.; Khil, O.; Lviv Polytechnic National University
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    Self-organising map as a tool of modelling the design parameters of microelectronics devices for ensuring the specified temperature condition
    (Українські технології, 2006) Bilas, O.; Levus, E.; Yakovyna, V.
    Using Kohonen maps the analysis and visualisation of thermal management task for flip-chip microelectronic devices have been carried out. The advantages of neural networks techniques over most common ones are demonstrated. The technique is very promising for making a prediction of device parameters for ensuring the specified temperature conditions.
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    Variables state-based software usage model
    (Commission of Motorization and Energetics in Agriculture, 2014) Fedasyuk, D.; Yakovyna, V.; Serdyuk, P.; Nytrebych, O.
    This article describes a new mathematical software usage model, which includes the effect of the set of global and external variables values for further analysis of multi-test scenarios to improve the effectiveness of the testing software. This model is represented as a graph of transitions and a set of variables with respective sets of equivalence classes. The proposed approach is particularly relevant for computational algorithms with complex logic.