Сучасні проблеми радіоелектроніки, телекомунікацій, комп'ютерної інженерії

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Author: search.filters.author.Bobalo, YuriySubject: search.filters.subject.design reliability

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    Devices and systems design reliability estimation
    (Видавництво Львівської політехніки, 2012) Nedostup, Leonid; Bobalo, Yuriy; Kiselychnyk, Myroslav; Lazko, Oxana
    The updated approach for devices and systems reliability estimation was proposed. An two-dimensional "Stress–strength" probability model based on application of Gram-Charlier and Edgeworth rows was obtained.