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Електронний архів Науково-технічної бібліотеки
Матеріали конференцій
Сучасні проблеми радіоелектроніки, телекомунікацій, комп'ютерної інженерії
Сучасні проблеми радіоелектроніки, телекомунікацій, комп'ютерної інженерії
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search.filters.author.Lazko, Oxana
1
search.filters.author.Bobalo, Yuriy
1
search.filters.author.Kiselychnyk, Myroslav
1
search.filters.author.Nedostup, Leonid
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search.filters.subject.Gram-Charlier rows
1
search.filters.subject.design reliability
1
search.filters.subject.stress-strength models
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2012
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Devices and systems design reliability estimation
(
Видавництво Львівської політехніки
,
2012
)
Nedostup, Leonid
;
Bobalo, Yuriy
;
Kiselychnyk, Myroslav
;
Lazko, Oxana
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The updated approach for devices and systems reliability estimation was proposed. An two-dimensional "Stress–strength" probability model based on application of Gram-Charlier and Edgeworth rows was obtained.
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