Матеріали конференцій
Permanent URI for this communityhttps://ena.lpnu.ua/handle/ntb/56937
Browse
5 results
Search Results
Item Software implementation of electronic texbooks "Fundamentals of the theory of electronic circuits"(Видавництво Львівської політехніки, 2011) Bobalo, Yuriy; Stakhiv, Petro; Mandziy, Bohdan; Shakhovska, Natalia; Holoshchuk, RomanThis document has considered the experience of developing electronic textbook "Fundamentals of the theory of electronic circuits". Filed under concept, structure and principles of development of the electronic textbook. Detailed procedure for evaluation of knowledge.Item Predicting the reliability of radio-electronic devices by the results of production defectiveness monitoring(Видавництво Львівської політехніки, 2011) Bobalo, Yuriy; Nedostup, Leonid; Kiselychnyk, Myroslav; Melen, MyhayloThis work is devoted to modeling and optimization of radio-electronic devices production processes to ensure the desired reliability.Item Reliability analysis of technical systems without redundancy with limited number of repairs(Видавництво Львівської політехніки, 2012) Bobalo, Yuriy; Mandziy, Bohdan; Volochiy, Bohdan; Osirkovskyy, LeonidThe object of consideration is the construction of analytical models non-redundant maintainable system with a limited number of repairs. On the basis of the constructed model the analysis of reliability indexes - availability and the probability of downtime is carried out.Item Devices and systems design reliability estimation(Видавництво Львівської політехніки, 2012) Nedostup, Leonid; Bobalo, Yuriy; Kiselychnyk, Myroslav; Lazko, OxanaThe updated approach for devices and systems reliability estimation was proposed. An two-dimensional "Stress–strength" probability model based on application of Gram-Charlier and Edgeworth rows was obtained.Item Content and modern trends of reliability aspect in radioelectronic designing(Видавництво Львівської політехніки, 2010) Bobalo, Yuriy; Mandziy, BohdanThe article deals with modern development trends and the content of the problems concerning reliability aspect of radioelectronic device designing at the different hierarchic designing levels.