Enhancing the metrological autonomy of local measurement systems

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dc.citation.epage56
dc.citation.issue2
dc.citation.journalTitleВимірювальна техніка та метрологія
dc.citation.spage52
dc.contributor.affiliationLviv Polytechnic National University
dc.contributor.affiliationLviv Polytechnic National University
dc.contributor.authorMykyichuk, Bohdan
dc.contributor.authorSasovets, Nazar
dc.coverage.placenameЛьвів
dc.coverage.placenameLviv
dc.date.accessioned2025-11-25T13:14:06Z
dc.date.created2025-06-20
dc.date.issued2025-06-20
dc.description.abstractThis article presents a study on the prospects of ensuring measurement traceability through the implementation of methods aimed at increasing the metrological autonomy of measurement systems for various branches of industry and science.
dc.format.extent52-56
dc.format.pages5
dc.identifier.citationMykyichuk B. Enhancing the metrological autonomy of local measurement systems / Bohdan Mykyichuk, Nazar Sasovets // Measuring Equipment and Metrology. — Lviv : Lviv Politechnic Publishing House, 2025. — Vol 86. — No 2. — P. 52–56.
dc.identifier.citation2015Mykyichuk B., Sasovets N. Enhancing the metrological autonomy of local measurement systems // Measuring Equipment and Metrology, Lviv. 2025. Vol 86. No 2. P. 52–56.
dc.identifier.citationenAPAMykyichuk, B., & Sasovets, N. (2025). Enhancing the metrological autonomy of local measurement systems. Measuring Equipment and Metrology, 86(2), 52-56. Lviv Politechnic Publishing House..
dc.identifier.citationenCHICAGOMykyichuk B., Sasovets N. (2025) Enhancing the metrological autonomy of local measurement systems. Measuring Equipment and Metrology (Lviv), vol. 86, no 2, pp. 52-56.
dc.identifier.doihttps://doi.org/10.23939/istcmtm2025.02.052
dc.identifier.urihttps://ena.lpnu.ua/handle/ntb/121883
dc.language.isoen
dc.publisherВидавництво Львівської політехніки
dc.publisherLviv Politechnic Publishing House
dc.relation.ispartofВимірювальна техніка та метрологія, 2 (86), 2025
dc.relation.ispartofMeasuring Equipment and Metrology, 2 (86), 2025
dc.relation.referencesen[1] B. Jeckelmann, R. Edelmaier. Metrological Infrastructure. Berlin, Boston: De Gruyter Oldenbourg; 2023.DOI: 10.1515/9783110715835
dc.relation.referencesen[2] ДСТУ EN ISO 10012:2022 Measurement control systems. Requirements for measurement processes and measuring equipment (EN ISO 10012:2003, IDT; ISO 10012:2003, IDT):https://online.budstandart.com/ua/catalog/docpage.html?id_doc=109991
dc.relation.referencesen[3] Shnayder Т., Helvig N., Shutze А. (2018). Monitoring industrial conditions with smart sensors using automated feature extraction and selection. Measurement Science and Technology, 29 (9), 094002. DOI: https://doi.org/10.1088/1361-6501/aad1d4
dc.relation.referencesen[4] S. Yatsyshyn, R. Baitsar, S. Lazarenko, N. Lazarenko, R. Mastylo, Metrological risks and state of the monitored objects, Measurement Science and Technology, vol. 83, iss. 1,2022; pp. 17–23, https://doi.org/10.23939/istcmtm2022.01.017
dc.relation.referencesen[5] S. Yatsyshyn, S. Lazarenko, N. Lazarenko “Calibration of ionizing radiation dosimetric devices” Metrology and devices, No. 4 (84), 2020, 40–43. https://doi.org/10.33955/2307-2180(3)2020,40-43.
dc.relation.referencesen[6] Oksana Honsor, Oleksandr Demidov, Application of serverless systems for processing metrological metadata in IOT, vol. 85, No. 4, pp. 25–29, 2024. https://doi.org/10.23939/ istcmtm2024.04.025
dc.relation.referencesen[7] Probability theory and mathematical statistics: a textbook / A. V. Tyurin, A. Yu. Akhmerov. Odessa: Odessa I. I. Mechnikov National University, 2020. 138 p. https://dspace.onu.edu.ua/server/api/core/bitstreams/473b48be-9885-49c7-9a66-19606f656eb5/content
dc.relation.referencesen[8] Shambhu N. Sharma and Hiren G. Patel. The Fokker-Planck Equation, Stochastic Control, Chris Myers (Ed.), ISBN: 978-953-307-121-3, InTech, 2010, Available from: http://www.intechopen.com/books/stochastic-control/thefokker-planck-equation.
dc.relation.urihttps://online.budstandart.com/ua/catalog/docpage.html?id_doc=109991
dc.relation.urihttps://doi.org/10.1088/1361-6501/aad1d4
dc.relation.urihttps://doi.org/10.23939/istcmtm2022.01.017
dc.relation.urihttps://doi.org/10.33955/2307-2180(3)2020,40-43
dc.relation.urihttps://doi.org/10.23939/
dc.relation.urihttps://dspace.onu.edu.ua/server/api/core/bitstreams/473b48be-9885-49c7-9a66-19606f656eb5/content
dc.relation.urihttp://www.intechopen.com/books/stochastic-control/thefokker-planck-equation
dc.rights.holder© Національний університет „Львівська політехніка“, 2025
dc.subjectMeasurement traceability
dc.subjectmetrological support
dc.subjectmetrological autonomy
dc.subjectlocal measurement systems
dc.titleEnhancing the metrological autonomy of local measurement systems
dc.typeArticle

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Вимірювальна техніка та метрологія. – 2025. – Випуск 86, №2