Study of surface microstrains by electron speckle-interferometrymethods

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dc.citation.epage42
dc.citation.issue1
dc.citation.spage37
dc.contributor.affiliationSouth Ukrainian National Pedagogical University named after K. D. Ushynsky, Odesa, Ukraine
dc.contributor.authorGokhman, Olexsandr
dc.contributor.authorKondrya, Marianna
dc.coverage.placenameLviv
dc.date.accessioned2018-03-06T14:30:01Z
dc.date.available2018-03-06T14:30:01Z
dc.date.created2017-01-01
dc.date.issued2017-01-01
dc.date.submitted2017-07-05
dc.description.abstractDespite the fact that speckle interferometry methods began to develop more than 30 years ago, they still remain a rather exotic laboratory tool that has not received wide practical application in tensometry measurements and flaw detection. There are two reasons. The first one is the problem to interpret the interferograms by the right way. The second one is the extremely low measurement speed, which makes it impossible to use these methods for study of fast processes. In this paper we propose the advanced algorithm for electronic speckle interferometry (ESPI) method, which uses the arctangent of the intensity ratio of the speckles of two quarter-phase shifted specklograms, from that the position of the surface points with a known time step is calculated. Summing the increments of displacements after each measurement, we obtain a picture of the distribution of the strains of the surface of the object under study in the 3-dimensional representation customary for the experimenter. This approach effectively solves the first mentioned problem. While considering the second problem, it is shown that the measurement speed can be raised to the speed of the camera used (up to 1000 measurements per second in the flesh) if at the calibration stage a pair of speckles on the spectrograph is determined, whose phase is shifted by a quarter, and then take the arctangent of their ratio Intensities. In this case, there is no need to displace the reference beam, and the calculation of the displacement of the surface is made entirely from one specklogram only. Despite the fact that in this case the resolving power of the method bit decreases, the measurement speed increases substantially and there is no effect of the dynamic characteristics of the elements of the reference arm of the speckle interferometer on the measurement result, which is especially important in high-speed photography. The suggested algorithm for ESPI provides the extension of the diapason of recorded microstrains to hundreds of microns as well as on-line observation in 3D mode. New perspectives of nanoscale technologies could be opened on this way.
dc.format.extent37-42
dc.format.pages6
dc.identifier.citationZhukovskiy V. Study of surface microstrains by electron speckle-interferometrymethods / Vadym Zhukovskiy, Olexsandr Gokhman, Marianna Kondrya // Ukrainian Journal Of Mechanical Engineering Andmaterials Science. — Lviv : Lviv Politechnic Publishing House, 2017. — Vol 3. — No 1. — P. 37–42.
dc.identifier.issn2411-8001
dc.identifier.urihttps://ena.lpnu.ua/handle/ntb/39552
dc.language.isoen
dc.publisherLviv Politechnic Publishing House
dc.relation.ispartofUkrainian Journal Of Mechanical Engineering Andmaterials Science, 1 (3), 2017
dc.relation.references[1] Reasons and Methods for Electronic Processing in Coherent Light Systems for Engineering Measurement / J. N. Butters, J. A. Leendertz // Proc. Electro-Opt. Int. – 1971. – Brightox. – England. – P. 189.
dc.relation.references[2] Investigation of Loading Parameters in Detection of Internal Cracks of Composite Material with Digital Shearography / Davood Akbari, Naser Soltani // World Applied Sciences Journal, 2013, 21 (4), pp. 526–535.
dc.relation.references[3] Relation between a linear thermal expansion coefficient and residual stresses / V. Zhukovskiy, A. Gokhman // Technical Physics, 2009, vol. 54, no. 4, pp. 535–541.
dc.relation.references[4] Спосіб швидкісного вимірювання зміни фази об’єктної хвилі методом фазомодульованої спекл- інтерферометрії: пат. 105297 Україна, МПК G 01 В 9/021 (2006.01) / А. Ю. Попов, О. В. Тюрин, О. Я. Бекшаєв., В. Я. Гоцульський; заявник і патентовласник Одеський нац. ун-т ім. І. І. Мечникова. – № а2012 15004; заявл. 27.12.2012; опубл. 25.02.2014, Бюл. № 4. – 4 с.
dc.relation.references[5] Спекл-интерферометрия / В. П. Рябухо // Соросовский образовательный журнал. – 2001. – № 5. – С. 102–109.
dc.relation.references[6] Method of determining small linear displacement / A. Yu. Popov, W. M. Belous, V. P. Churashev, L. I. Manchenko, V. E. Mandel, Yu. B. A. V. Shugailo, Tyurin // Proceedings of the SPIE, Vol. 3904, p. 291–295 (1999).
dc.relation.references[7] Two approaches to the blind phase shift extraction for two-step electronic speckle pattern interferometry / L. Muravsky, A. Kmet’, T. Voronyak // Optical Engineering, 2013, 52(10), pp. 101909-1–101909-9.
dc.relation.referencesen[1] Reasons and Methods for Electronic Processing in Coherent Light Systems for Engineering Measurement, J. N. Butters, J. A. Leendertz, Proc. Electro-Opt. Int, 1971, Brightox, England, P. 189.
dc.relation.referencesen[2] Investigation of Loading Parameters in Detection of Internal Cracks of Composite Material with Digital Shearography, Davood Akbari, Naser Soltani, World Applied Sciences Journal, 2013, 21 (4), pp. 526–535.
dc.relation.referencesen[3] Relation between a linear thermal expansion coefficient and residual stresses, V. Zhukovskiy, A. Gokhman, Technical Physics, 2009, vol. 54, no. 4, pp. 535–541.
dc.relation.referencesen[4] Sposib shvydkisnoho vymiriuvannia zminy fazy obiektnoi khvyli metodom fazomodulovanoi spekl- interferometrii: pat. 105297 Ukraine, MPK G 01 V 9/021 (2006.01), A. Yu. Popov, O. V. Tiuryn, O. Ya. Bekshaiev., V. Ya. Hotsulskyi; zaiavnyk i patentovlasnyk Odeskyi nats. un-t im. I. I. Mechnykova, № a2012 15004; Decl. 27.12.2012; Publ. 25.02.2014, Bull. No 4, 4 p.
dc.relation.referencesen[5] Spekl-interferometriia, V. P. Riabukho, Sorosovskii obrazovatelnyi zhurnal, 2001, No 5, P. 102–109.
dc.relation.referencesen[6] Method of determining small linear displacement, A. Yu. Popov, W. M. Belous, V. P. Churashev, L. I. Manchenko, V. E. Mandel, Yu. B. A. V. Shugailo, Tyurin, Proceedings of the SPIE, Vol. 3904, p. 291–295 (1999).
dc.relation.referencesen[7] Two approaches to the blind phase shift extraction for two-step electronic speckle pattern interferometry, L. Muravsky, A. Kmet’, T. Voronyak, Optical Engineering, 2013, 52(10), pp. 101909-1–101909-9.
dc.rights.holder© Національний університет "Львівська політехніка"
dc.rights.holder© Zhukovskiy V., Gokhman O., Kondrya M., 2017
dc.subjectspeckle interferometry
dc.subjecttensometry measurements
dc.subjectspace distribution of strains
dc.titleStudy of surface microstrains by electron speckle-interferometrymethods
dc.typeArticle

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Ukrainian Journal of Mechanical Engineering and Materials Science. – 2017. – Vol. 3, No. 1