Identification of the Defect in the Elastic Layer by Sounding of the Normal Sh-Wave

Abstract

The Fourier integral transform has been used to reduce the diffraction problem of the normal SH-wave on a semi-infinite rigid inclusion in the elastic layer to the Wiener-Hopf equation. Its solution is obtained by the factorization method. The analytical expressions of the diffracted displacement fields have been represented in any region of interest. The dependences of the scattered field on the parameters of the structure have been given. The properties of identification of the inclusion type defect in the plane layer have been illustrated.