Browsing by Author "Onanko, Y. A."
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Item Inelastic Defect Characteristic Internal Friction in SiO2, GeSi and Anisotropy Automated System “KERN-DP”(2017-05-29) Onanko, A. P.; Prodayvoda, G. T.; Onanko, Y. A.; Shabatura, A. V.; Onischenko, A. N.; Kyiv National University, Kyiv, UkraineItem Inelastic-elastic properties of SiO2, SiO2 + TiO2 + ZrO2(Видавництво Львівської політехніки, 2012) Onanko, A. P.; Kulish, M. P.; Lyashenko, O. V.; Prodayvoda, G. T.; Vyzhva, S. A.; Onanko, Y. A.A non-destructive method for the technological control of the structure defects in SiO2 + Si wafers by measuring the internal friction background difference on the nearby harmonics f1 and f2 after mechanical and heat treatments.