Вісники та науково-технічні збірники, журнали
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Item SH-wave scattering from the interface defect(Lviv Politechnic Publishing House, 2020) Voytko, Myron; Kulynych, Yaroslav; Kuryliak , Dozyslav; Karpenko Physico-Mechanical Institute of the NAS of UkraineThe problem of the elastic SH-wave diffraction from the semi-infinite interface defect in the rigid junction of the elastic layer and the half-space is solved. The defect is modeled by the impedance surface. The solution is obtained by the Wiener-Hopf method. The dependences of the scattered field on the structure parameters are presented in analytical form. Verifica¬tion of the obtained solution is presented.