SH-wave scattering from the interface defect
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Date
2020
Journal Title
Journal ISSN
Volume Title
Publisher
Lviv Politechnic Publishing House
Abstract
The problem of the elastic SH-wave diffraction from the semi-infinite interface defect in the rigid junction of the elastic layer and the half-space is solved. The defect is modeled by the impedance surface. The solution is obtained by the Wiener-Hopf method. The dependences of the scattered field on the structure parameters are presented in analytical form. Verifica¬tion of the obtained solution is presented.
Description
Keywords
Elastic layer, impedance, rigid junction, defect, diffraction, normal wave, Wiener-Hopf technique
Citation
Voytko M. SH-wave scattering from the interface defect / Myron Voytko, Yaroslav Kulynych, Dozyslav Kuryliak // Advances in Cyber-Physical Systems. – Lviv : Lviv Politechnic Publishing House, 2020. – Volume 5, № 1. – P. 44–49 . – Bibliography: 29 titles.