Electrical characterisation of an oxide-pn-junction under illumination

dc.contributor.authorSaucke, Gesine
dc.contributor.authorHoffmann, Joerg
dc.contributor.authorNorpoth, Jonas
dc.contributor.authorZhu, Yimei
dc.contributor.authorJooss, Christian
dc.date.accessioned2010-06-18T07:18:00Z
dc.date.available2010-06-18T07:18:00Z
dc.date.issued2009
dc.identifier.citationElectrical characterisation of an oxide-pn-junction under illumination / G. Saucke, J. Hoffmann, J. Norpoth, Yi. Zhu, Ch. Jooss // Oxide materials for electronic engineering – fabrication, properties and application OMEE-2009 : international scientific workshop, June 22–26, 2009, Lviv, Ukraine : book of abstracts / Lviv Polytechnic National University. – Lviv, 2009. – P. 195.uk_UA
dc.identifier.urihttps://ena.lpnu.ua/handle/ntb/5511
dc.language.isoenuk_UA
dc.publisherВидавництво національного університету „Львівська політехніка”uk_UA
dc.subjectstrontium titanate (STO)uk_UA
dc.subjectmaterialuk_UA
dc.titleElectrical characterisation of an oxide-pn-junction under illuminationuk_UA
dc.typearticleuk_UA

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