Electrical characterisation of an oxide-pn-junction under illumination
dc.contributor.author | Saucke, Gesine | |
dc.contributor.author | Hoffmann, Joerg | |
dc.contributor.author | Norpoth, Jonas | |
dc.contributor.author | Zhu, Yimei | |
dc.contributor.author | Jooss, Christian | |
dc.date.accessioned | 2010-06-18T07:18:00Z | |
dc.date.available | 2010-06-18T07:18:00Z | |
dc.date.issued | 2009 | |
dc.identifier.citation | Electrical characterisation of an oxide-pn-junction under illumination / G. Saucke, J. Hoffmann, J. Norpoth, Yi. Zhu, Ch. Jooss // Oxide materials for electronic engineering – fabrication, properties and application OMEE-2009 : international scientific workshop, June 22–26, 2009, Lviv, Ukraine : book of abstracts / Lviv Polytechnic National University. – Lviv, 2009. – P. 195. | uk_UA |
dc.identifier.uri | https://ena.lpnu.ua/handle/ntb/5511 | |
dc.language.iso | en | uk_UA |
dc.publisher | Видавництво національного університету „Львівська політехніка” | uk_UA |
dc.subject | strontium titanate (STO) | uk_UA |
dc.subject | material | uk_UA |
dc.title | Electrical characterisation of an oxide-pn-junction under illumination | uk_UA |
dc.type | article | uk_UA |