Analysis of Electromigration in MWO4 (M=Ca, Cd, Pb, Zn) Crystals and their Structural Defects
Date
2017-05-29
Authors
Journal Title
Journal ISSN
Volume Title
Publisher
Abstract
Description
Keywords
Citation
Shevchuk V. N. Analysis of Electromigration in MWO4 (M=Ca, Cd, Pb, Zn) Crystals and their Structural Defects / V. N. Shevchuk, I. V. Kayun // Oxide Materials
for Electronic Engineering –
fabrication, properties
and applications : book
of abstracts international conference, May 29–June 2, 2017
Lviv, Ukraine. — Lviv, 2017. — P. 61. — (2 active media fundamentals: crystal structure and defects).