Analysis of Electromigration in MWO4 (M=Ca, Cd, Pb, Zn) Crystals and their Structural Defects

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Shevchuk V. N. Analysis of Electromigration in MWO4 (M=Ca, Cd, Pb, Zn) Crystals and their Structural Defects / V. N. Shevchuk, I. V. Kayun // Oxide Materials for Electronic Engineering – fabrication, properties and applications : book of abstracts international conference, May 29–June 2, 2017 Lviv, Ukraine. — Lviv, 2017. — P. 61. — (2 active media fundamentals: crystal structure and defects).

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