Modeling of property evaluation of system-oriented measuring instruments

Abstract

The main purpose of system-oriented measuring instruments (MI) is to ensure automated collection, processing, analysis and transmission of measurement data as part of complex information and measurement systems. Such MI are used in automated production systems, intelligent measuring systems, in the control of technological processes and in conducting scientific research, etc. The main properties of system-oriented MI are provided by a combination of modern hardware, powerful digital processing algorithms and integration into automated systems. They implement microprocessor systems with the implementation of self-diagnostic algorithms, built-in real-time controllers, etc. They have a modular architecture with the possibility of software configurability. In addition to the traditionalMI testing methods, system-orientedMI is subject to mandatory testing of its software. To build a mathematical model of a system-oriented MI, a block-hierarchical approach was applied for different hierarchical levels. The mathematical modeling conducted allowed us to develop a multiple model of the system of indicators of the MI properties. The proposed model allows for the study of the influence of the MI properties and their evaluation at all stages of the MI life cycle. It also allows taking into account specific parameters of the MI properties and the corresponding methods for their determination. The model allows taking into account the features of system-oriented MIs, in particular, indicators of the MI’s properties in terms of ensuring system functions and the corresponding methods for their determination. At each phase of the MI life cycle, both the appropriate verification for the sets of MI properties and their validation should be carried out. When implementing these procedures, it is necessary to use the established requirements of widely used international and regional metrology guidelines.