Investigation of the chromium ions recharging kinetics in Cr,Mg:YAG epitaxial films during high-temperature annealing

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dc.contributor.authorBuryy, O.
dc.contributor.authorUbizskii, S.
dc.contributor.authorSyvorotka, I. I.
dc.contributor.authorBecker, K.-D.
dc.date.accessioned2010-06-18T09:56:42Z
dc.date.available2010-06-18T09:56:42Z
dc.date.issued2009
dc.identifier.citationBuryy O. Investigation of the chromium ions recharging kinetics in Cr,Mg:YAG epitaxial films during high-temperature annealing / O. Buryy, S. Ubizskii, I. I. Syvorotka, K.-D. Becker // Oxide materials for electronic engineering – fabrication, properties and application OMEE-2009 : international scientific workshop, June 22–26, 2009, Lviv, Ukraine : book of abstracts / Lviv Polytechnic National University. – Lviv, 2009. – P. 144.uk_UA
dc.identifier.urihttps://ena.lpnu.ua/handle/ntb/5545
dc.language.isoenuk_UA
dc.publisherВидавництво національного університету „Львівська політехніка”uk_UA
dc.subjectfilmuk_UA
dc.subjectkineticuk_UA
dc.subjectcrystaluk_UA
dc.titleInvestigation of the chromium ions recharging kinetics in Cr,Mg:YAG epitaxial films during high-temperature annealinguk_UA
dc.typearticleuk_UA

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Оксидні матеріали електронної техніки – отримання, властивості, застосування. – 2009 р.