Advances In Cyber-Physical Systems. – 2020. – Vol. 5, No. 1

Permanent URI for this collectionhttps://ena.lpnu.ua/handle/ntb/57222

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Засновник і видавець Національний університет «Львівська політехніка». Виходить двічі на рік з 2016 року.

Advances in Cyber-Physical Systems / Lviv Polytechnic National University ; editor-in-chief A. Melnyk. – Lviv : Lviv Politechnic Publishing House, 2020. – Volume 5, number 1. – 52 p. : il.

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Start date: 2020Subject: search.filters.subject.Elastic layer, impedance, rigid junction, defect, diffraction, normal wave, Wiener-Hopf technique

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    SH-wave scattering from the interface defect
    (Lviv Politechnic Publishing House, 2020) Voytko, Myron; Kulynych, Yaroslav; Kuryliak , Dozyslav; Karpenko Physico-Mechanical Institute of the NAS of Ukraine
    The problem of the elastic SH-wave diffraction from the semi-infinite interface defect in the rigid junction of the elastic layer and the half-space is solved. The defect is modeled by the impedance surface. The solution is obtained by the Wiener-Hopf method. The dependences of the scattered field on the structure parameters are presented in analytical form. Verifica¬tion of the obtained solution is presented.