Вісники та науково-технічні збірники, журнали
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Item SH-wave scattering from the interface defect(Lviv Politechnic Publishing House, 2020) Voytko, Myron; Kulynych, Yaroslav; Kuryliak , Dozyslav; Karpenko Physico-Mechanical Institute of the NAS of UkraineThe problem of the elastic SH-wave diffraction from the semi-infinite interface defect in the rigid junction of the elastic layer and the half-space is solved. The defect is modeled by the impedance surface. The solution is obtained by the Wiener-Hopf method. The dependences of the scattered field on the structure parameters are presented in analytical form. Verifica¬tion of the obtained solution is presented.Item Identification of the Defect in the Elastic Layer by Sounding of the Normal Sh-Wave(Видавництво Львівської політехніки, 2019-02-26) Voytko, Myron; Kulynych, Yaroslav; Grynenko, Mychaylo; Kuryliak, Dozyslaw; Karpenko Physico-Mechanical Institute of the NAS of UkraineThe Fourier integral transform has been used to reduce the diffraction problem of the normal SH-wave on a semi-infinite rigid inclusion in the elastic layer to the Wiener-Hopf equation. Its solution is obtained by the factorization method. The analytical expressions of the diffracted displacement fields have been represented in any region of interest. The dependences of the scattered field on the parameters of the structure have been given. The properties of identification of the inclusion type defect in the plane layer have been illustrated.