Trap Settings for the Free Charge Carriers
Date
2017-05-29
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Citation
Degoda V. Ya. Trap Settings for the Free Charge Carriers / V. Ya. Degoda, M. Alizadeh, N. Yu. Pavlova // Oxide Materials
for Electronic Engineering –
fabrication, properties
and applications : book
of abstracts international conference, May 29–June 2, 2017
Lviv, Ukraine. — Lviv, 2017. — P. 66. — (2 active media fundamentals: crystal structure and defects).