A study of the feasibility of using low cost thick film tracks in the lower part of the microwave spectrum

dc.citation.journalTitleЕлементи теорії та прилади твердотілої електроніки
dc.contributor.affiliationITME Institute of Electronic Materials Techology, Warsaw, Polanduk_UA
dc.contributor.affiliationMiddlesex University, London, UKuk_UA
dc.contributor.authorJakubowska, Małgorzata
dc.contributor.authorPitt, Keith
dc.coverage.countryUAuk_UA
dc.coverage.placenameЛьвівuk_UA
dc.date.accessioned2018-08-28T14:23:09Z
dc.date.available2018-08-28T14:23:09Z
dc.date.issued2002
dc.description.abstractConventionally it is accepted that conductors for low microwave applications should meet a range of electrical and topographic criteria in order to perform correctly. These include a minimum thickness due to skin effects, smooth track and substrate surfaces and rectilinear geometry. The metal must also be very dense and uniform and have the highest possible electrical conductivity. As a result, photolithographically defined gold tracks are preferred and may be made in either thick or thin film.uk_UA
dc.format.pages109–116
dc.identifier.citationJakubowska M. A study of the feasibility of using low cost thick film tracks in the lower part of the microwave spectrum / M. Jakubowska, K. Pitt // Вісник Національного університету "Львівська політехніка". – 2002. – № 458 : Елементи теорії та прилади твердотілої електроніки. – С. 109–116. – Bibliography: 4 titles.uk_UA
dc.identifier.urihttps://ena.lpnu.ua/handle/ntb/42528
dc.language.isoenuk_UA
dc.publisherВидавництво Національного університету "Львівська політехніка"uk_UA
dc.relation.references[1] K. E. G Pitt, C. E. Free, D. Q. Li, P. Barnwell, “The Influence of Materials Properties on the Design of MCM and Microstrip Structures”, J. Mat. Sci., Materials in Electronics, 10, 1999, 519-524. [2] T. Edwards, "Foundations for Microstrip Circuit Design", 2nd Edition, John Wiley and Sons, 1992. Loss (dB/mm) at 10 GHz v DC Rs 0.010 0.015 0.020 0.025 0.030 0.035 0.040 8 10 12 14 16 18 20 22 24 Conductor l Sheet resistance (m ohms/sq.) 50 ohm prediction measured 10 Ghz Lviv Polytechnic National University Institutional Repository http://ena.lp.edu.ua 116 [3] K. Pitt, C Free, Z. Tian, M. Jakubowska, “A Method for the Prediction of Microwave Properties of Thick Film Conductors from Physical Measurements and DC Conductivity”, J. Mat. Sci., Materials in Electronics, 12, (2001), 491-495 [4] K. Pitt, C Free, Z. Tian, M. Jakubowska, Proc. XXVI International Conference IMAPS Poland, Preparation and Properties of Microstrip Lines on Substrates of Different Thickness for Low Cost Applications, 12-17, 2002uk_UA
dc.rights.holder© Małgorzata Jakubowska, Keith Pitt, 2002uk_UA
dc.subjectThick film conductorsuk_UA
dc.subjectmicrowave propertiesuk_UA
dc.subjectmicrowave measurementsuk_UA
dc.subjectquality controluk_UA
dc.titleA study of the feasibility of using low cost thick film tracks in the lower part of the microwave spectrumuk_UA
dc.typeArticleuk_UA

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