Aspects of EMC- Evaluation of LIN- Transceivers

dc.citation.conferenceЕлементи теорії та прилади твердотілої електроніки
dc.contributor.affiliationFTZ e.V. an der Westsächsischen Hochschule Zwickau (FH), University of Applied Sciences, Zwickauuk_UA
dc.contributor.affiliationRzeszów University of Technologyuk_UA
dc.contributor.authorKörber, B.
dc.contributor.authorSperling, D.
dc.contributor.authorKalita, W.
dc.contributor.authorSabat, W.
dc.coverage.countryUAuk_UA
dc.coverage.placenameЛьвівuk_UA
dc.date.accessioned2018-09-12T08:29:53Z
dc.date.available2018-09-12T08:29:53Z
dc.date.issued2002
dc.description.abstractWith this paper a proposal for EMC- Evaluation of LIN (Line Integrated Network)-Transceiver is presented. It is based on EMC- standards for semiconductors and automotive applications and can be applied to Stand Alone LIN Transceiver and Embedded Systems with an on chip LIN Transceiver (Automotive System Basis Chips). At this time there are positive experiences by using this evaluation proposal on LIN Transceivers from different manufactures and samples in the last two years. It can be shown, that the results of the measurements have a very good reproducibility. The proposal for EMC- Evaluation of LIN- Transceivers is based on the same procedure as EMC- Evaluation of CAN – Transceivers, witch is successful implemented in Transceiver evaluation for automotive applications and has a correlation to vehicle measurements.uk_UA
dc.format.pages286–289
dc.identifier.citationAspects of EMC- Evaluation of LIN- Transceivers / B. Körber, D. Sperling, W. Kalita, W. Sabat // Вісник Національного університету "Львівська політехніка". – 2002. – № 458 : Елементи теорії та прилади твердотілої електроніки. – С. 286–289. – Bibliography: 4 titles.uk_UA
dc.identifier.urihttps://ena.lpnu.ua/handle/ntb/42627
dc.language.isoenuk_UA
dc.publisherВидавництво Національного університету «Львівська політехніка»uk_UA
dc.relation.references[1] DIN - IEC 62132 Integrierte Schaltungen – Messung der elektromagnetischen Störfestigkeit. [2] IC IEC 61967, Integrated circuits- Measurement of Electromagnetic Emissions. [3] EN 61000-4-2, Electrostatic Discharge Testing [4] Pfaff W., Scheider G., Störfestigkeitsprüfungen von Halbleiterschaltkreisen. EMC Kompedium 2000.uk_UA
dc.titleAspects of EMC- Evaluation of LIN- Transceiversuk_UA
dc.typeArticleuk_UA

Files

Original bundle

Now showing 1 - 1 of 1
Thumbnail Image
Name:
55_286-289.pdf
Size:
221.69 KB
Format:
Adobe Portable Document Format
Description: