Electrical, mechanical and thermal properties of thick film resistors on dielectrics
| dc.citation.epage | 25 | |
| dc.citation.issue | 542 : Елементи теорії та прилади твердотілої електроніки | |
| dc.citation.journalTitle | Вісник Національного університету “Львівська політехніка” | |
| dc.citation.spage | 14 | |
| dc.contributor.affiliation | Institute of Electronic Materials Technology, Warsaw | |
| dc.contributor.affiliation | Middlesex University, London | |
| dc.contributor.author | Jakubowska, Małgorzata | |
| dc.contributor.author | Pitt, Keith | |
| dc.coverage.placename | Львів | |
| dc.coverage.placename | Lviv | |
| dc.date.accessioned | 2020-03-12T13:44:24Z | |
| dc.date.available | 2020-03-12T13:44:24Z | |
| dc.date.created | 2005-03-01 | |
| dc.date.issued | 2005-03-01 | |
| dc.description.abstract | Описано останні дослідження в області сумісності товстоплівкових та резистивних комбінацій. Розглянуті причини реакції між матеріалами та подальші зміни в електричних параметрах. Новорозроблені серії резисторів на основі оксиду рутенію демонструють значно кращу електричну і механічну сумісність, ніж старі комбінації. Термографічне картографування і комп’ютерне моделювання розподілу теплових полів навколо нагрітого резистора демонструють значне зростання на нижньому провідному шарі. | |
| dc.description.abstract | This paper examines recent developments in the fabrication of compatible thick film dielectric and resistor combinations. It discusses the causes of reactions between materials and the consequent electrical changes. Results are presented showing that the newly developed ruthenium oxide based resistor series tested here has significantly better electrical and mechanical compatibility than older combinations. Piezoelectric studies show that Gauge Factors, (G.F.), of this series are significantly higher than found in earlier materials on both alumina and dielectric. Thermographic mapping and computer simulation of temperature distribution around heated resistors on alumina and on dielectric on alumina both show a significant rise on the lower conductivity layer. | |
| dc.format.extent | 14-25 | |
| dc.format.pages | 12 | |
| dc.identifier.citation | Jakubowska M. Electrical, mechanical and thermal properties of thick film resistors on dielectrics / Małgorzata Jakubowska, Keith Pitt // Вісник Національного університету “Львівська політехніка”. — Львів : Видавництво Національного університету “Львівська політехніка”, 2005. — № 542 : Елементи теорії та прилади твердотілої електроніки. — С. 14–25. | |
| dc.identifier.citationen | Jakubowska M. Electrical, mechanical and thermal properties of thick film resistors on dielectrics / Małgorzata Jakubowska, Keith Pitt // Visnyk Natsionalnoho universytetu "Lvivska politekhnika". — Lviv : Vydavnytstvo Natsionalnoho universytetu "Lvivska politekhnika", 2005. — No 542 : Elementy teorii ta prylady tverdotiloi elektroniky. — P. 14–25. | |
| dc.identifier.uri | https://ena.lpnu.ua/handle/ntb/47356 | |
| dc.language.iso | en | |
| dc.publisher | Видавництво Національного університету “Львівська політехніка” | |
| dc.relation.ispartof | Вісник Національного університету “Львівська політехніка”, 542 : Елементи теорії та прилади твердотілої електроніки, 2005 | |
| dc.relation.references | 1. Vest R.W., Conduction Mechanisms in Thick Film Microcircuits, Final Report, DAHC15-70-97, 1975. | |
| dc.relation.references | 2. Joshi B., Pitt K. E. G., Winster A.E., The properties of thick film resistors on dielectrics, Microelectronics J., 13, no. 5, 1982. – pp.4–11. | |
| dc.relation.references | 3. Adie G., Hołodnik B., Pitt K., SEM/EDX analyses of some interactions between thick film resistors and dielectrics, Microelectronics J., 15,1984, no 2. – pp.38–43. | |
| dc.relation.references | 4. Pitt K. E. G., Thick Film Resistors on Dielectrics, M.Phil Thesis, CNAA, Middlesex Polytechnic 1987. | |
| dc.relation.references | 5. Bober B., Pitt K. E.G., Further studies of the interaction between thick film resistors and dielectric, Microelectronics J., 18, 1987, no 1, – pp.35–43. | |
| dc.relation.references | 6. Bober B., Pitt K.E.G., Licznerski B.W., Bober Z., The effect of constituent exchange on the conduction mechanisms of thick film resistors on dielectrics, Mat. Sci., 1987, no 3–4, – pp.193–198. | |
| dc.relation.references | 7. Cattaneo A., Pirozzi L., Morten B., Prudenziati M., Influence of the substrate on electrical properties of thick film resistors, Electrocomp. Sci. and Techn., 6, 1980, – pp.247–251. | |
| dc.relation.references | 8. Cattaneo A., Pirozzi L., Morten B., Prudenziati M., Influence of the substrate on electrical properties of thick film resistors, IEEE Trans. on CHMT, 3, 1980, no 1, – pp.181–186. | |
| dc.relation.references | 9. Coleman MV., Ageing mechanism and stability in thick film resistors, Hybrid Circuits, 4, 1984, – pp.36–41. | |
| dc.relation.references | 10. Pitt K.E.G., Chemical constitution and conduction mechanisms in thick film resistors, Journal of Materials Science: Materials in Electronics, 7 (1996), 187–190. | |
| dc.relation.references | 11. Achmatowicz S., Jakubowska M., Zwierkowska E., Szczytko B., Szymański D., Insulating paste, Pat. No. RP 162992, (In Polish) | |
| dc.relation.references | 12. Belavic D., Pavlin M., Grame S., Santo-Zarnik M., Hrovat M., Some Applications of Thick-Film Strain Gauge, Proc. IMAPS Poland , Rytro, September 2000. – pp.85–91 | |
| dc.relation.references | 13. Szczepański Z., Jakubowska M., Materials and Piezoresistivity Measurement Method for Thick Film Pressure Sensors, Trans. on the Precision and Electronic Technology, vol.4 (1999), – pp. 51–56. | |
| dc.relation.references | 14. Pitt K. E. G., Hołodnik B., Whitaker R., Piezoelectric effects in resistors on dielectrics, Internepcon UK, 1985. – pp. 217–227. | |
| dc.relation.references | 15. Achmatowicz S., Jakubowska M., Zwierkowska E., Gielisse P., Niculescu H., Tremblay J., Golonka L., Zawada T., Shipilo V., Shishinik E., Gameza L., High Thermal Conductivity Cubic Boron Nitride Thick Films, Proc. IMAPS 2001, 34th Int. Symp. on Microelectronics, Oct.9-1 1, 2001, Baltimore USA, – pp. 379–383 October 1989. – pp.107–110. | |
| dc.relation.references | 16. Jakubowska M., Hotra Z., Klepacki D., Modelling of Thermal properties of thick film resistors on dielectric multilayer structure, Technical News, No 1-2 (12-13), 2001, pp.149-151. [20] Pitt K. E. G., Thick film distributed notch filters, Microelectronics J., 9, 1, 18–21, 1978. | |
| dc.relation.references | 17. Pitt K. E. G., Thick film distributed notch filters, Microelectronics J., 9, 1, 18–21, 1978. | |
| dc.relation.references | 18. Licznerski B. W., Pitt K. E. G., Seweryn A., Analysis of strain induced properties of thick film resistors on dielectrics., Pro. 13th Conf. ISHM Poland, Szklarska Poręba, | |
| dc.relation.references | 19. Pitt K. E. G., personal communication to P. Gielisse, September 2000 | |
| dc.relation.references | 20. Niculescu H., Gielisse P. J., Tremblay J. P., Achmatowicz S., Jakubowska M., Zwierkowska E., Current-Voltage characteristics of co-fired cubic boron nitride, Proc. 26th Conf. IMAPS Poland, Warsaw 25-27, 2002, – pp. 185–190. | |
| dc.relation.referencesen | 1. Vest R.W., Conduction Mechanisms in Thick Film Microcircuits, Final Report, DAHC15-70-97, 1975. | |
| dc.relation.referencesen | 2. Joshi B., Pitt K. E. G., Winster A.E., The properties of thick film resistors on dielectrics, Microelectronics J., 13, no. 5, 1982, pp.4–11. | |
| dc.relation.referencesen | 3. Adie G., Hołodnik B., Pitt K., SEM/EDX analyses of some interactions between thick film resistors and dielectrics, Microelectronics J., 15,1984, no 2, pp.38–43. | |
| dc.relation.referencesen | 4. Pitt K. E. G., Thick Film Resistors on Dielectrics, M.Phil Thesis, CNAA, Middlesex Polytechnic 1987. | |
| dc.relation.referencesen | 5. Bober B., Pitt K. E.G., Further studies of the interaction between thick film resistors and dielectric, Microelectronics J., 18, 1987, no 1, pp.35–43. | |
| dc.relation.referencesen | 6. Bober B., Pitt K.E.G., Licznerski B.W., Bober Z., The effect of constituent exchange on the conduction mechanisms of thick film resistors on dielectrics, Mat. Sci., 1987, no 3–4, pp.193–198. | |
| dc.relation.referencesen | 7. Cattaneo A., Pirozzi L., Morten B., Prudenziati M., Influence of the substrate on electrical properties of thick film resistors, Electrocomp. Sci. and Techn., 6, 1980, pp.247–251. | |
| dc.relation.referencesen | 8. Cattaneo A., Pirozzi L., Morten B., Prudenziati M., Influence of the substrate on electrical properties of thick film resistors, IEEE Trans. on CHMT, 3, 1980, no 1, pp.181–186. | |
| dc.relation.referencesen | 9. Coleman MV., Ageing mechanism and stability in thick film resistors, Hybrid Circuits, 4, 1984, pp.36–41. | |
| dc.relation.referencesen | 10. Pitt K.E.G., Chemical constitution and conduction mechanisms in thick film resistors, Journal of Materials Science: Materials in Electronics, 7 (1996), 187–190. | |
| dc.relation.referencesen | 11. Achmatowicz S., Jakubowska M., Zwierkowska E., Szczytko B., Szymański D., Insulating paste, Pat. No. RP 162992, (In Polish) | |
| dc.relation.referencesen | 12. Belavic D., Pavlin M., Grame S., Santo-Zarnik M., Hrovat M., Some Applications of Thick-Film Strain Gauge, Proc. IMAPS Poland , Rytro, September 2000, pp.85–91 | |
| dc.relation.referencesen | 13. Szczepański Z., Jakubowska M., Materials and Piezoresistivity Measurement Method for Thick Film Pressure Sensors, Trans. on the Precision and Electronic Technology, vol.4 (1999), pp. 51–56. | |
| dc.relation.referencesen | 14. Pitt K. E. G., Hołodnik B., Whitaker R., Piezoelectric effects in resistors on dielectrics, Internepcon UK, 1985, pp. 217–227. | |
| dc.relation.referencesen | 15. Achmatowicz S., Jakubowska M., Zwierkowska E., Gielisse P., Niculescu H., Tremblay J., Golonka L., Zawada T., Shipilo V., Shishinik E., Gameza L., High Thermal Conductivity Cubic Boron Nitride Thick Films, Proc. IMAPS 2001, 34th Int. Symp. on Microelectronics, Oct.9-1 1, 2001, Baltimore USA, pp. 379–383 October 1989, pp.107–110. | |
| dc.relation.referencesen | 16. Jakubowska M., Hotra Z., Klepacki D., Modelling of Thermal properties of thick film resistors on dielectric multilayer structure, Technical News, No 1-2 (12-13), 2001, pp.149-151. [20] Pitt K. E. G., Thick film distributed notch filters, Microelectronics J., 9, 1, 18–21, 1978. | |
| dc.relation.referencesen | 17. Pitt K. E. G., Thick film distributed notch filters, Microelectronics J., 9, 1, 18–21, 1978. | |
| dc.relation.referencesen | 18. Licznerski B. W., Pitt K. E. G., Seweryn A., Analysis of strain induced properties of thick film resistors on dielectrics., Pro. 13th Conf. ISHM Poland, Szklarska Poręba, | |
| dc.relation.referencesen | 19. Pitt K. E. G., personal communication to P. Gielisse, September 2000 | |
| dc.relation.referencesen | 20. Niculescu H., Gielisse P. J., Tremblay J. P., Achmatowicz S., Jakubowska M., Zwierkowska E., Current-Voltage characteristics of co-fired cubic boron nitride, Proc. 26th Conf. IMAPS Poland, Warsaw 25-27, 2002, pp. 185–190. | |
| dc.rights.holder | © Національний університет “Львівська політехніка”, 2005 | |
| dc.rights.holder | © Jakubowska Małgorzata, Keith Pitt, 2005 | |
| dc.title | Electrical, mechanical and thermal properties of thick film resistors on dielectrics | |
| dc.type | Article |
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