Trace impurities, intrinsic and radiation defects in oxide materials
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Видавництво національного університету “Львівська політехніка”
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Trace impurities, intrinsic and radiation defects in oxide materials / V. Grachev, G. Malovichko, J. Jorgensen, M. Meyer, V. Pankratov, Ya. Burak, A. Hunt // Oxide materials for electronic engineering – fabrication, properties and application OMEE-2009 : international scientific workshop, June 22–26, 2009, Lviv, Ukraine : book of abstracts / Lviv Polytechnic National University. – Lviv, 2009. – P. 113.