Trace impurities, intrinsic and radiation defects in oxide materials
| dc.contributor.author | Grachev, V. | |
| dc.contributor.author | Malovichko, G. | |
| dc.contributor.author | Jorgensen, J. | |
| dc.contributor.author | Meyer, M. | |
| dc.contributor.author | Pankratov, V. | |
| dc.contributor.author | Burak, Ya. | |
| dc.contributor.author | Hunt, A. | |
| dc.date.accessioned | 2010-06-16T12:29:39Z | |
| dc.date.available | 2010-06-16T12:29:39Z | |
| dc.date.issued | 2009 | |
| dc.identifier.citation | Trace impurities, intrinsic and radiation defects in oxide materials / V. Grachev, G. Malovichko, J. Jorgensen, M. Meyer, V. Pankratov, Ya. Burak, A. Hunt // Oxide materials for electronic engineering – fabrication, properties and application OMEE-2009 : international scientific workshop, June 22–26, 2009, Lviv, Ukraine : book of abstracts / Lviv Polytechnic National University. – Lviv, 2009. – P. 113. | uk_UA |
| dc.identifier.uri | https://ena.lpnu.ua/handle/ntb/5287 | |
| dc.language.iso | en | uk_UA |
| dc.publisher | Видавництво національного університету “Львівська політехніка” | uk_UA |
| dc.subject | Electron Paramagnetic Resonance (EPR) | uk_UA |
| dc.subject | NASA | uk_UA |
| dc.title | Trace impurities, intrinsic and radiation defects in oxide materials | uk_UA |
| dc.type | article | uk_UA |