SH-wave scattering from the interface defect
| dc.citation.epage | 49 | |
| dc.citation.issue | Volume 5, № 1 | |
| dc.citation.journalTitle | Advances in Cyber-Physical Systems | |
| dc.citation.spage | 44 | |
| dc.contributor.affiliation | Karpenko Physico-Mechanical Institute of the NAS of Ukraine | |
| dc.contributor.author | Voytko, Myron | |
| dc.contributor.author | Kulynych, Yaroslav | |
| dc.contributor.author | Kuryliak , Dozyslav | |
| dc.date.accessioned | 2022-11-28T10:14:06Z | |
| dc.date.available | 2022-11-28T10:14:06Z | |
| dc.date.issued | 2020 | |
| dc.date.submitted | 2022 | |
| dc.description.abstract | The problem of the elastic SH-wave diffraction from the semi-infinite interface defect in the rigid junction of the elastic layer and the half-space is solved. The defect is modeled by the impedance surface. The solution is obtained by the Wiener-Hopf method. The dependences of the scattered field on the structure parameters are presented in analytical form. Verifica¬tion of the obtained solution is presented. | |
| dc.format.pages | 44-49 | |
| dc.identifier.citation | Voytko M. SH-wave scattering from the interface defect / Myron Voytko, Yaroslav Kulynych, Dozyslav Kuryliak // Advances in Cyber-Physical Systems. – Lviv : Lviv Politechnic Publishing House, 2020. – Volume 5, № 1. – P. 44–49 . – Bibliography: 29 titles. | |
| dc.identifier.uri | https://ena.lpnu.ua/handle/ntb/57228 | |
| dc.language.iso | en | |
| dc.publisher | Lviv Politechnic Publishing House | |
| dc.relation.ispartof | Advances in Cyber-Physical Systems | |
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| dc.subject | Elastic layer, impedance, rigid junction, defect, diffraction, normal wave, Wiener-Hopf technique | |
| dc.title | SH-wave scattering from the interface defect | |
| dc.type | Article |
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