Surface plasmon polaritons in dielectric/metal/dielectric structures: metal layer thickness influence

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dc.citation.epage115
dc.citation.issue1
dc.citation.spage109
dc.contributor.affiliationНаціональний університет “Львівська політехніка”
dc.contributor.affiliationLviv Polytechnic National University
dc.contributor.authorКостробій, П.
dc.contributor.authorПольовий, В.
dc.contributor.authorKostrobij, P.
dc.contributor.authorPolovyi, V.
dc.coverage.placenameЛьвів
dc.coverage.placenameLviv
dc.date.accessioned2020-02-27T09:45:16Z
dc.date.available2020-02-27T09:45:16Z
dc.date.created2019-02-26
dc.date.issued2019-02-26
dc.description.abstractЗапропоновано та досліджено модель, яка дає змогу пояснити експериментальні дані щодо впливу товщини металевого прошарку на спектр SPP хвиль у гетерогенних структурах “діелектрик–метал–діелектрик”.
dc.description.abstractA model is proposed and studied that makes it possible to explain experimental data on a metal layer thickness influence on the spectrum of SPPs waves in heterogeneous dielectric/metal/dielectric structures.
dc.format.extent109-115
dc.format.pages7
dc.identifier.citationKostrobij P. Surface plasmon polaritons in dielectric/metal/dielectric structures: metal layer thickness influence / P. Kostrobij, V. Polovyi // Mathematical Modeling and Computing. — Lviv : Lviv Politechnic Publishing House, 2019. — Vol 6. — No 1. — P. 109–115.
dc.identifier.citationenKostrobij P. Surface plasmon polaritons in dielectric/metal/dielectric structures: metal layer thickness influence / P. Kostrobij, V. Polovyi // Mathematical Modeling and Computing. — Lviv : Lviv Politechnic Publishing House, 2019. — Vol 6. — No 1. — P. 109–115.
dc.identifier.urihttps://ena.lpnu.ua/handle/ntb/46146
dc.language.isoen
dc.publisherLviv Politechnic Publishing House
dc.relation.ispartofMathematical Modeling and Computing, 1 (6), 2019
dc.relation.references1. Maier S.A. Plasmonics: Fundamentals and Application. Springer, New York (2007).
dc.relation.references2. Jackson J.D. Classical Electrodynamics. John Wiley & Sons (2007).
dc.relation.references3. Landau L.D., Bell J. S., KearsleyM. J, Pitaevskii L.P, LifshitzE.M., Sykes J.B. Electrodynamics of Continuous Media. Elsevier, Vol. 8 (2013).
dc.relation.references4. AshcroftN.W., MerminN.D. Solid State Physics. Harcourt College Publishers (1976).
dc.relation.references5. Zakaria M. Abd El-Fattah et al. Plasmonics in atomically-thin crystalline silver films. arXiv:1901.07739 (2019).
dc.relation.references6. Vakarchuk I.O. Kvantova mekhanika. Lviv, LNU im. I. Franka (2007), (in Ukrainian).
dc.relation.references7. KurbatskyV.P. Dielectric tensor of low-dimensionalmetal systems. J. Exp. Theor. Phys. 125 (1), 148-158 (2017).
dc.relation.references8. Landau L.D., LifshitzE.M. Statistical Physics. Elsevier, Vol. 5 (2013).
dc.relation.references9. KostrobijP.P., MarkovychB.M. Effect of Coulomb interaction on chemical potential of metal film. Philosophical Magazine. 98 (21), 1991–2002 (2018).
dc.relation.references10. KostrobijP.P., MarkovychB.M. The chemical potential and the work function of a metal film on a dielectric substrate. Philosophical Magazine Letters. 99 (1), 12–20 (2019).
dc.relation.references11. KostrobijP., PavlyshV., NevinskyiD., PolovyiV. SPP waves in “dielectric–metal–dielectric” structures: influence of exchange correlations. Math. Model. Comput. 4 (2), 184–192 (2017).
dc.relation.references12. KostrobijP.P., PolovyiV.Y. Influence of the thickness of a metal nanofilm on the spectrum of surface plasmons. Proc. of the 15th International Conference on the Experience of Designing and Application of CAD Systems (CADSM), pp. 5/58–5/61.
dc.relation.references13. KostrobijP.P., MarkovychB.M. Effect of the film thickness on the effective electron–electron interaction in a metal film. Math. Model. Comput. 5 (1), 21–26 (2018).
dc.relation.referencesen1. Maier S.A. Plasmonics: Fundamentals and Application. Springer, New York (2007).
dc.relation.referencesen2. Jackson J.D. Classical Electrodynamics. John Wiley & Sons (2007).
dc.relation.referencesen3. Landau L.D., Bell J. S., KearsleyM. J, Pitaevskii L.P, LifshitzE.M., Sykes J.B. Electrodynamics of Continuous Media. Elsevier, Vol. 8 (2013).
dc.relation.referencesen4. AshcroftN.W., MerminN.D. Solid State Physics. Harcourt College Publishers (1976).
dc.relation.referencesen5. Zakaria M. Abd El-Fattah et al. Plasmonics in atomically-thin crystalline silver films. arXiv:1901.07739 (2019).
dc.relation.referencesen6. Vakarchuk I.O. Kvantova mekhanika. Lviv, LNU im. I. Franka (2007), (in Ukrainian).
dc.relation.referencesen7. KurbatskyV.P. Dielectric tensor of low-dimensionalmetal systems. J. Exp. Theor. Phys. 125 (1), 148-158 (2017).
dc.relation.referencesen8. Landau L.D., LifshitzE.M. Statistical Physics. Elsevier, Vol. 5 (2013).
dc.relation.referencesen9. KostrobijP.P., MarkovychB.M. Effect of Coulomb interaction on chemical potential of metal film. Philosophical Magazine. 98 (21), 1991–2002 (2018).
dc.relation.referencesen10. KostrobijP.P., MarkovychB.M. The chemical potential and the work function of a metal film on a dielectric substrate. Philosophical Magazine Letters. 99 (1), 12–20 (2019).
dc.relation.referencesen11. KostrobijP., PavlyshV., NevinskyiD., PolovyiV. SPP waves in "dielectric–metal–dielectric" structures: influence of exchange correlations. Math. Model. Comput. 4 (2), 184–192 (2017).
dc.relation.referencesen12. KostrobijP.P., PolovyiV.Y. Influence of the thickness of a metal nanofilm on the spectrum of surface plasmons. Proc. of the 15th International Conference on the Experience of Designing and Application of CAD Systems (CADSM), pp. 5/58–5/61.
dc.relation.referencesen13. KostrobijP.P., MarkovychB.M. Effect of the film thickness on the effective electron–electron interaction in a metal film. Math. Model. Comput. 5 (1), 21–26 (2018).
dc.rights.holderCMM IAPMM NAS
dc.rights.holder© 2019 Lviv Polytechnic National University
dc.subjectповерхневі плазмони
dc.subjectспектр плазмона
dc.subjectтовщина металевого шару
dc.subjectдіелектрична проникність
dc.subjectsurface plasmon
dc.subjectplasmon spectrum
dc.subjectmetal layer thickness
dc.subjectdielectric permittivity
dc.subject.udc537.5.8
dc.subject.udc535.5
dc.subject.udc519.6
dc.titleSurface plasmon polaritons in dielectric/metal/dielectric structures: metal layer thickness influence
dc.title.alternativeПоверхневі плазмон–поляритони в структурах “діелектрик–метал–діелектрик”: вплив товщини металевого прошарку
dc.typeArticle

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Mathematical Modeling And Computing. – 2019. – Vol. 6, No. 1