Reliability improvement in consequence of investigation PCB silver electrochemical migrations

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2002

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Видавництво Національного університету "Львівська політехніка"

Abstract

Looking for a compromise between high functionality and convenient and effective materials the silver has got many proved and achievements qualities for PCB. The main problem in using as a constructive materials its high disposition of migration. The investigation of a concrete type of migration between silver conductors is the goal of the paper. For this purpose an investigation techniques is presented to qualifying PCB structures. Some test structures are designed and produced and experimental results are results are analyzed.

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Keywords

Silver electrochemicalmigration, Electrochemisty, Conductive films, Reliability, Failure analysis, Multichip modules

Citation

Jordanov N. S. Reliability improvement in consequence of investigation PCB silver electrochemical migrations / Nikola Stefanov Jordanov, Anna Stoynova Andonova, Natasha Georgieva Atanasova // Вісник Національного університету "Львівська політехніка". – 2002. – № 458 : Елементи теорії та прилади твердотілої електроніки. – С. 138–144. – Bibliography: 4 titles.

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